Solution grown Pt>i_xCoxS semiconductor nanoparticle films
نویسندگان
چکیده
Pbi-xCoxS ternary alloy films were grown using solution growth technique. X-ray fluorescence spectroscopy was used for compositional analysis. X-ray di9raction and atomic force microscopy analysis indicate the presence of nanometer-size grains in the films. Size dependence of optical band gap (Eg) is observed in the ternary nanoparticle films. Increase in Eg and decrease in DC-conductivity with increase in Co concentration is also observed. PACS: 81.05.Hd; 81.05.Ys; 81.10.Dn
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تاریخ انتشار 2006